Signal Integrity Studio
With Signal Integrity Studio, users analyze the effects that impedance mismatches, losses, emphasis and equalization choices have on signal integrity characteristics of a device under test. S-parameters measured from an imported Touchstone file are used to emulate or de-embed a channel. Models for emphasis and equalization and a simulated waveform are configured by the user, and the resulting eye diagram can be viewed and analyzed to provide insight into the eye closure and jitter characteristics of the DUT and receiver design.
SI Studio runs on top of the LeCroy SPARQ software application – users purchasing the standalone version of SI Studio receive a USB license key, which unlocks access to Signal Integrity Studio features of the SPARQ application, without the need to connect to a SPARQ.
For the version of Signal Integrity Studio that is an option for the SPARQ Series Signal Integrity Network Analyzers, see SI Studio for LeCroy SPARQ.
- Full signal integrity analysis of equalized receiver signal
- Fast eye diagramming
- Advanced jitter analysis
- Co-simulation of measured and/or modeled network characteristics
- De-embedding and emulation of channel and fixture responses
- Emulation of CTLE, DFE & FFE equalizers and PLL
- Operates independently on a user's PC and when connected to a LeCroy SPARQ
End-to-end Signal Integrity Workstation
With Signal Integrity Studio, users simulate serial data patterns and analyze the effects that impedance mismatches, losses and equalization choices have on signal integrity characteristics of a device under test. S-parameters measured from a connected LeCroy SPARQ or from a Touchstone 1.0 file are used to emulate or de-embed a channel, and equalization is configured by the user, resulting in simulated receiver waveforms that can be viewed, sliced into eye diagrams and analyzed to provide insight into the eye closure and jitter characteristics of the DUT and receiver design.
See Effects of Measured S-parameters Immediately
Signal Integrity Studio works seamlessly with the SPARQ Series Signal Integrity Network Analyzers. S-parameters measured live by the SPARQ link directly to user's configuration for channel and fixture emulation or de-embedding configuration. As the SPARQ acquires new S-parameters, the application rapidly shows the affect of the newly acquired measurements. The SPARQ measures 40 GHz S-parameters with single button press operation at a fraction of the price of a VNA, and is available in 2, 4 and, coming soon 8- and 12-port versions.
Simulate Serial Data Patterns with Impairments
Signal Integrity Studio analysis begins with a long serial data pattern output from the built-in simulator. Serial data waveform types include NRZ, RZ, bpNZ and clock. Impairments such as vertical noise, horizontal jitter, overshoot/undershoot, periodic jitter aggressors and ISI can be configured. Waveforms previously saved on LeCroy oscilloscopes can be used as a signal source.
Determine Optimal Equalizer Settings
Users can open up closed eyes via a simple GUI for configuring pre-emphasis, de-emphasis, continuous time linear equalization (CTLE), feed forward equalization (FFE) or decision feedback equalization (DFE) filters, and standard or customizable PLL settings. Users can configure settings manually, or allow the software to configure automatically.
Rapidly Form Eye Diagrams
The equalized signal is rapidly sliced into component unit intervals and an eye diagram created that is available for analysis. Users can display up to 11 eye diagram measurements, and perform mask testing to determine if the channel and equalizer settings result in a compliant eye.
Analyze Jitter in Time and Frequency Domains
Signal Integrity Studio has >15 views of jitter to give insight into the affects of jitter aggressors and consequences of signal integrity issues in the design of the channel and equalizer. Jitter analysis includes standard Tj, Rj and Dj dual-dirac model measurements, jitter spectrum, jitter histogram and more.